FAULT DIAGNOSIS OF SUBTHRESHOLD LEAKAGE CURRENT DEFECTS IN DRAM. International Journal of Engineering Sciences & Management Research, [S. l.], v. 3, n. 1, p. 131–139, 2016. Disponível em: https://ijesmr.com/index.php/ijesmr/article/view/186. Acesso em: 4 feb. 2026.